SANTA ROSA, Calif.--(BUSINESS WIRE)--Keysight Technologies, Inc. (NYSE: KEYS), a leading technology company that delivers advanced design and validation solutions to help accelerate innovation to ...
The Mann-Whitney U Test, also known as the Wilcoxon Rank Sum Test, is a non-parametric statistical test used to compare two samples or groups. The Mann-Whitney U Test assesses whether two sampled ...
The foundation of parametric test within semiconductor manufacturing is its usefulness in determining that wafers have been fabricated properly. Foundries use parametric test results to help verify ...
Keithley Instruments has announced the publication of Parallel Test Technology: The New Paradigm for Parametric Testing, a handbook that covers semiconductor parametric testing. The free, 60-page book ...
When evaluating risk exposure, many organizations have adopted the value at risk, or VaR, metric, which is a statistical risk management technique measuring the maximum loss that an investment ...
Today’s devices are required to pass thousands of parametric tests prior to being shipped to customers. A key challenge test engineers face, in addition to optimizing the number of tests they run on ...
Scandinavian Journal of Statistics, Vol. 28, No. 4 (Dec., 2001), pp. 725-732 (8 pages) We consider the comparison of point processes in a discrete observation situation in which each subject is ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback